AFM and SEM images of the same sample area - indenter experiment on copper


SEM-Image: A silicon tip indents a cooper material from the right side


Sanning electron microscope (SEM) image: A tip indents a copper sample from the right side. The surface of the copper sample (left) shows characteristic material transformations, which were afterwards investigated with GETec's in-situ AFM (AFSEMTM) => see image below.


AFM image: slip-steps on the copper surface

AFM image of the copper sample surface with characteristic material transformations (slip steps, traces of permanent deformation).

image x/y-range: 5.4 ┬Ám

image z-range: -300 nm to 136.5 nm