Application Notes

Image: AFSEM and tensile stageA scanning electron microscope (SEM) is a powerful tool to study the surface changes and fracture mechanics of tensile stress samples. However, quantitative height information and crack/roughness analysis with sub-nanometer resolution is not possible with the SEM. With AFSEM™, the strengths of SEM and AFM are easily combined with tensile stages for correlative, in-situ analysis of tensile stress samples. Read more...

 


With AFSEM™ the gradual increase of conductivity in a partial electron beam irradiated carbon matrix (Pt(C)) can be studied directly between  irradiation steps, without sample transfer. Since the measurements are performed in the vacuum of the SEM, contamination issues that are generally encountered in air are reduced. For such measurements the AFSEM™ works with conductive, self-sensing cantilevers with sharp, solid platinum tips. Read more...

 


nanoindentationSEM is widely used to study the surface structure after nanoindentation. The combination of a large field of view with nanometer resolution allows detecting early stages of crack formation, slip steps, and other surface defects indicating the onset of material surface failure. However, quantitative height information is not available in an SEM. Read more...