AFSEM™ Webinar

Introducing the leading solution for correlative AFM-SEM-EDX analysis — March 15, 2017


Enjoy our AFSEMTM webinar: Start!


AFSEM from GETec-Micrsoscopy and Quanta FEI SEM


The combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM™ enables you to easily combine three of the most powerful analysis techniques available — AFM, SEM, and EDX — to greatly extend your correlative microscopy and analysis possibilities.

Watch the high impact webinar from Nanosurf and GETec Microscopy to explore the recent advances in correlative AFM-SEM-EDX analysis and learn how to combine these techniques in an interactive experiment.

Topics will include:

  • Introduction and overview of the AFSEM™ system
  • Compatibility to existing SEMs and additional add-ons (e.g. tensile stages or nanoindenters)
  • Recent application advances (e.g. in-situ roughness and conductivity analysis, correlative SEM/EDX/AFM, 3D tomography)


combined AFM-SEM imaging, EDX, conductive, topography

Combined SEM imaging, chemical analysis by EDX, AFM topography, and conductivity analysis


Contact our experts (Dr. Christian Schwalb or Dr. Marcel Winhold) to answer your specific AFSEM™ application and instrumentation questions! Phone: +43-1-8904345-15

Enjoy our AFSEMTM webinar: Start!