Next Events

GETec Microscopy will present its AFSEMTM at the Microscience Microscopy Congress exhibition in Manchester, UK (Manchester Central Convention Complex). We are looking forward to meeting you there!

 

mmc2017 logo

 


The growing importance of FIB-based processing during the last decade is highlighted by the first workshop of the “European Ion Beam Network” following 11 successful years of the “D-A-CH FIB Arbeitskreis” in Graz, Austria. As Platinum sponsor, GETec Microscopy proudly presents the AFSEM™ as a powerful tool for in-situ correlative SEM/FIB/AFM analysis. Meet us at our booth to learn more about applications and find out how you can scientifically benefit from the new correlative analysis capabilities in your dual beam system. We are looking forward to meeting you!

 

   

 


GETec Microscopy will present its AFSEMTM at the Microscopy & Microanalysis 2017 Meeting in the America's Center Convention Complex in St. Louis, Missouri, USA. Furthermore two talks are planned. We are looking forward to meeting you there!

 

M&M 2017

 


GETec Microscopy will present its AFSEMTM together with its partner Nanosurf at the Microscopy Conference 2017 in Lausanne, Switzerland. Furthermore one talk is planned. We are looking forward to meeting you there!

 

 


GETec Microscopy attends the conference of the Croatian microscopy society in Croatia, Rovinj.