Next Events

GETec Microscopy attends the conference Sensor + Test 2017 in N├╝rnberg Germany. Our vice director Dr. Christian Schwalb will give a talk with the title "Self-Sensing Cantilever Sensors for Correlative In-Situ Analysis of Nanostructured Materials". We are looking forward to meeting you there!

 

 


GETec Microscopy will present its AFSEMTM at the Microscience Microscopy Congress exhibition in Manchester, UK (Manchester Central Convention Complex). We are looking forward to meeting you there!

 

mmc2017 logo

 


GETec Microscopy will present its AFSEMTM at the European Focused Ion Beam Workshop exhibition in Graz, Austria. We are looking forward to meeting you there!

 

 


GETec Microscopy will present its AFSEMTM at the Microscopy & Microanalysis 2017 Meeting in the America's Center Convention Complex in St. Louis, Missouri, USA. Furthermore two talks are planned. We are looking forward to meeting you there!

 

M&M 2017

 


GETec Microscopy will present its AFSEMTM together with its partner Nanosurf at the Microscopy Conference 2017 in Lausanne, Switzerland. Furthermore one talk is planned. We are looking forward to meeting you there!

 

 


GETec Microscopy attends the conference of the Croatian microscopy society in Croatia, Rovinj.