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Mr. Peter Ziger from the GETec Microscopy GmbH (Austria) is kindly invited from the Center for electron microscopy and microanalysis (CEMM), IJS to give a lecture on correlative SEM/AFM/EDX microscopy. The lecture will be held on Tuesday, October 24, at 3:00 p.m. in the Kolar lecture room at the Jo┼żef Stefan Institute, Jamova 39, Ljubljana, Slovenia.

 

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