Welcome to GETec Microscopy

Did you know your SEM could do this?

Manifold applications with AFSEM

AFSEMTM by GETec Microscopy

GETec Microscopy offers innovative atomic force microscope (AFM) solutions for seamless integration into existing host systems like scanning electron microscopes (SEM).

 

In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.