Welcome to GETec Microscopy!

GETec Microscopy offers innovative atomic force microscope (AFM) solutions for seamless integration into existing host systems like scanning electron microscopes (SEM). In partnership with our customers, we develop dedicated nano analysis tools based on pre-engineered modules.

AFSEM™ — AFM in-situ SEM

"Two microscopes are better than one!"

AFSEM™ is an atomic force microscope (AFM) by GETec Microscopy, designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The complimentary image data of AFM and SEM enable unique characterization of your sample.

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Latest News:

    1. October 10-12: 4th International CISCEM in Saarbrücken, Germany
    2. October 3-5: 26th International Conference on Materials and Technology in Portoroz, SI
    3. September: AFSEM™ Article in Spectrum Magazine

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